Focused Ion Beam

1 week ago


Cupertino, United States HCLTech Full time

About HCLTech:

HCLTech is a global technology company, home to 221,000+ people across 60 countries, delivering industry-leading capabilities centered around digital, engineering and cloud, powered by a broad portfolio of technology services and products. We work with clients across all major verticals, providing industry solutions for Engineering Services, Manufacturing, Life Sciences and Healthcare, Technology and Services, Telecom and Media, Retail and CPG, and Public Services. To learn how we can supercharge progress for you, visit


Seeking an energetic individual as Focused Ion Beam (FIB)/TEM contractors to join our Failure Analysis lab. You will be part of a cross functional team concentrating on the development, characterization and failure analysis of next generation materials and products. Our scientists and engineers interact to comprehensively understand technical problems, urgency, and develop and execute analysis. The FIB/TEM contractor will be responsible for supporting process development, R&D and reliability sample prep and analysis, including TEM lamella. Working closely with other technical people within the team, be willing to learn new techniques such as STEM inverted, inverted prep, and large area TEM sample prep. You will be responsible to present ideas and results in technical reports.


Key Qualifications:

  • 2+ years of experience in Electron microscopy lab with an emphasis on materials science and microanalysis.
  • To be successful in this role, you should have an in-depth, hands-on understanding of Dual Beam FIB/SEM experience including experience with FIB preparation of TEM lamellae.
  • Software experience with Oxford Aztec and Image J is advantageous.
  • Excellent verbal and communication skills and are comfortable in communicating with cross-functional partners
  • Ability to balance multiple high priority tasks at the same time
  • Flexible and able to quickly change course to meet the needs of the business


Description:

We are looking for someone who thoughtfully resolves issues using creative ideas, has a strong FIB background and has a willingness to take the dual beam and make it sing. You must have extensive experience with focused ion beam (FIB), scanning electron microscopy (SEM), Energy dispersive spectroscopy (EDS), some experience with a wide variety of microscopy tools and must be willing to work hard. Education and experience AA or BS, Materials Science or a related discipline.